3rd International Conference on In-Situ and Correlative Electron Microscopy, Saarbrücken, Germany
October 11 - 12, 2016
CISCEM 2016 aims to bring together an interdisciplinary group of scientists from the fields of biology, materials science, geology, chemistry, and physics, to discuss future directions of in-situ electron microscopy research. Topics will include nanoscale studies of biological samples, and functional materials under realistic or near realistic conditions, for example, in gaseous environments, at elevated temperatures, and in liquid. It will be discussed how dynamical processes can be studied by including the time domain in electron microscopy, while taking into account the electron beam effects. CISCEM is also open to other in-situ techniques, such as X-ray, near field or scanning probe microscopy, with the view to stimulate fruitful discussions on multi-scale and correlative approaches.
Registration deadline: August 31, 2016
Abstract submission deadline: July 1, 2016